Fast and robust misalignment correction of Fourier ptychographic microscopy

Fourier ptychographic microscopy (FPM) is a newly developed computational imaging technique that can provide gigapixel images with both high resolution (HR) and wide field of view (FOV). However, the position misalignment of the LED array induces a degradation of the reconstructed image, especially in the regions away from the optical axis. In this paper, we propose a robust and fast method to correct the LED misalignment of the FPM, termed as misalignment correction for the FPM (mcFPM). Although different regions in the FOV have different sensitivity to the LED misalignment, the experimental results show that the mcFPM is robust with respect to the elimination of each region. Compared with the state-of-the-art methods, the mcFPM is much faster.